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Proceedings Paper

Spatially resolved measurement of slow-axis pseudo near field of diode laser arrays
Author(s): G. Seewald; Ruediger Grunwald
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Paper Abstract

Pseudo near-field intensity distributions of 1-cm diode-laser bars in slow-axis plane were recorded without parasitic feedback by automated scanning with a slanted highly-reflecting thin metal wire. Irregularities in field patterns are correlated with local curvature and twisting of facets. Information on mode guiding within the semiconductor laser can be derived.

Paper Details

Date Published: 17 February 2003
PDF: 6 pages
Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); doi: 10.1117/12.474836
Show Author Affiliations
G. Seewald, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Ruediger Grunwald, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)


Published in SPIE Proceedings Vol. 4833:
Applications of Photonic Technology 5

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