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Proceedings Paper

Process-based real-time scene data processor design for emitter array infrared projectors
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Paper Abstract

An alternative class of infrared projector real-time nonuniformity correction processor is introduced, based on the concept that the fundamental role of the processor is to reverse each of the projector processing steps as the input DAC voltage word is converted into infrared signal radiance output. The design is developed by assessment of the sequence of processes occurring within the projector and is tested by simulation. It is shown that there is potential for high fidelity nonuniformity correction across the infrared dynamic range without the need for the introduction of curve-fitting breakpoints.

Paper Details

Date Published: 12 July 2002
PDF: 16 pages
Proc. SPIE 4717, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII, (12 July 2002); doi: 10.1117/12.474713
Show Author Affiliations
Owen M. Williams, Defence Science and Technology Organisation (Australia)
Leszek Swierkowski, Defence Science and Technology Organisation (Australia)
Rhoe A. Thompson, Air Force Research Lab. (United States)
George C. Goldsmith, Air Force Research Lab. (United States)
W. Larry Herald, Macaulay Brown, Inc. (United States)


Published in SPIE Proceedings Vol. 4717:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII
Robert Lee Murrer, Editor(s)

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