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Proceedings Paper

1024x1024 resistive emitter array design and fabrication status
Author(s): Paul Tristan Bryant; Jim Oleson; Stephen W. McHugh; Eric Beuville; John D. Schlesselmann; James T. Woolaway; Steve Barskey; Steven Lawrence Solomon; Thomas W. Joyner
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Paper Abstract

Santa Barbara Infrared (SBIR) is producing a high performance 1,024 x 1,024 Large Format Resistive emitter Array (LFRA) for use in the next generation of IR Scene Projectors (IRSPs). LFRA requirements were developed through close cooperation with the Tri-Service IR Scene Projector working group, and through detailed trade studies sponsored by the OSD Central T&E Investment Program (CTEIP) and a Phase I US Navy Small Business Innovative Research (SBIR) contract. The CMOS Read-In Integrated Circuit (RIIC) is being designed by SBIR and Indigo Systems under a Small Business Innovative Research (SBIR) contract. Performance and features include 750 K MWIR maximum apparent temperature, 5 ms radiance rise time, 200 Hz full frame update, and 400 Hz window mode operation. Ten 8-inch CMOS wafers will be fabricated and characterized in mid-2002, followed by emitter fabrication in late 2002. This paper discusses array performance, requirements flow-down, array design, fabrication of 2 X 2-inch CMOS devices, and plans for subsequent RIIC wafer test and emitter pixel fabrication.

Paper Details

Date Published: 12 July 2002
PDF: 8 pages
Proc. SPIE 4717, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII, (12 July 2002); doi: 10.1117/12.474711
Show Author Affiliations
Paul Tristan Bryant, Santa Barbara Infrared, Inc. (United States)
Jim Oleson, Santa Barbara Infrared, Inc. (United States)
Stephen W. McHugh, Santa Barbara Infrared, Inc. (United States)
Eric Beuville, Indigo Systems Corp. (United States)
John D. Schlesselmann, Indigo Systems Corp. (United States)
James T. Woolaway, Indigo Systems Corp. (United States)
Steve Barskey, Indigo Systems Corp. (United States)
Steven Lawrence Solomon, Acumen Consulting (United States)
Thomas W. Joyner, Naval Air Warfare Ctr. (United States)


Published in SPIE Proceedings Vol. 4717:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII
Robert Lee Murrer, Editor(s)

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