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Proceedings Paper

Dynamic and static assessment of piezoelectric embedded composites
Author(s): Francois Cote; Patrice Masson; Nezih Mrad
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Paper Abstract

The design of fully integrated structures, and especially of new generation composites with embedded sensors and actuators, now requires the development of adequate tools for predicting the static and the dynamic behavior of the structure as well as its life cycle. These tools will provide flexibility in assessing well-suited control strategies for optimum structural performance. As a first step towards the development of integrated computational tools for smart structures, this work validates both theoretically and experimentally the implementation under MSC/NASTRAN of a simplified multilayer tri-dimensional model based on the analogy between thermal strains and piezoelectric strains. Numerical results obtained from this model are first compared to results obtained from a reference finite element tri-dimensional piezoelectric code developed to assess the thermal analogy for different loading conditions. Experimental validation is also conducted on a clamped AS4/3501-6 carbon/epoxy composite beam structure excited at the clamped end by an embedded piezoelectric. Results obtained from vibration testing are assessed with the thermal analogy model using a large number of tri-dimensional elements in order to get a detailed representation of the different variables. Details for practical implementation of the embedment procedures are presented along with the adequate model prediction of the structure's dynamic behavior.

Paper Details

Date Published: 15 July 2002
PDF: 10 pages
Proc. SPIE 4701, Smart Structures and Materials 2002: Smart Structures and Integrated Systems, (15 July 2002); doi: 10.1117/12.474667
Show Author Affiliations
Francois Cote, Univ. de Sherbrooke (Canada)
Patrice Masson, Univ. de Sherbrooke (Canada)
Nezih Mrad, National Research Council Canada (Canada)


Published in SPIE Proceedings Vol. 4701:
Smart Structures and Materials 2002: Smart Structures and Integrated Systems
L. Porter Davis, Editor(s)

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