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Proceedings Paper

Sub-arcsecond differential deflectometry to measure thermally induced distortions of the Swift optical bench
Author(s): Douglas B. Leviton; Brad J. Frey; Larry E. Madison; James A. Parker; Oren E. Sheinman
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Paper Abstract

The Swift optical bench is a roughly 2.7 m diameter, 0.1 m thick composite structure carrying the Burst Alert Telescope (BAT), X-ray Telescope (XRT), and the Ultraviolet Optical Telescope (UVOT) as well as various attitude control instrumentation for the spacecraft. A high precision test of the optical bench using multi-aperture optical deflectometry was developed to verify that the relative boresights of the XRT and UVOT instruments would not change by more than several arcseconds when a worst case on-orbit temperature gradient is imposed through the thickness of the bench. Results of validation tests in a laminar flow cleanroom environment without vibration isolation demonstrated a differential measurement capability with 0.2 arcsecond sensitivity and 0.5 arcsecond accuracy per day. The technique is easily adaptable to similar deflection monitoring requirements for other large spacecraft structures.

Paper Details

Date Published: 11 March 2003
PDF: 12 pages
Proc. SPIE 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, (11 March 2003); doi: 10.1117/12.474308
Show Author Affiliations
Douglas B. Leviton, NASA Goddard Space Flight Ctr. (United States)
Brad J. Frey, NASA Goddard Space Flight Ctr. (United States)
Larry E. Madison, NASA Goddard Space Flight Ctr. (United States)
James A. Parker, NASA Goddard Space Flight Ctr. (United States)
Oren E. Sheinman, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 4851:
X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy
Joachim E. Truemper; Harvey D. Tananbaum, Editor(s)

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