Proceedings PaperSurface texture characterization using a chroma meter
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This paper discusses surface texture characterization of silicon, silicon carbide and some metal surfaces using a Chroma Meter. The specimen surfaces were obtained with various machining methods. Lightness (brightness) has a good correlation with surface roughness and could be used as an in-process/in-cycle/post-process technique for surface texture characterization. Surfaces with lower roughness values had lower lightness values.