Proceedings PaperSurface texture characterization using a chroma meter
|Format||Member Price||Non-Member Price|
|GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free.||Check Access|
This paper discusses surface texture characterization of silicon, silicon carbide and some metal surfaces using a Chroma Meter. The specimen surfaces were obtained with various machining methods. Lightness (brightness) has a good correlation with surface roughness and could be used as an in-process/in-cycle/post-process technique for surface texture characterization. Surfaces with lower roughness values had lower lightness values.