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Proceedings Paper

Surface texture characterization using a chroma meter
Author(s): Zhaowei Zhong
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Paper Abstract

This paper discusses surface texture characterization of silicon, silicon carbide and some metal surfaces using a Chroma Meter. The specimen surfaces were obtained with various machining methods. Lightness (brightness) has a good correlation with surface roughness and could be used as an in-process/in-cycle/post-process technique for surface texture characterization. Surfaces with lower roughness values had lower lightness values.

Paper Details

Date Published: 17 February 2003
PDF: 6 pages
Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); doi: 10.1117/12.474041
Show Author Affiliations
Zhaowei Zhong, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 4833:
Applications of Photonic Technology 5

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