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Proceedings Paper

Measurement of nonlinear characteristics of silver-halide holographic materials by phase-contrast microscopy
Author(s): Istvan Banyasz
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Paper Abstract

Lin-curves of plane-wave phase holograms recorded in Agfa-Gevaert 8E75HD emulsions were measured for the combinations of AAC developer and the R9 bleaching agent. Then each holographic grating was studied by phase-contrast microscopy, using both medium-power (40 X) and high-power immersion (100 X) objectives. Thus, besides of the Lin-curves, the modulation of the refractive index as a function of the bias exposure and the visibility of the recording interference pattern can also been determined. This latter characteristics is used in coupled wave theory to calculate the diffraction efficiency of holographic gratings, thus the measured diffraction efficiencies can be compared to those predicted by the theory. Moreover, this direct study of the phase profile of the gratings can be used for optimising processing.

Paper Details

Date Published: 4 June 2003
PDF: 9 pages
Proc. SPIE 5005, Practical Holography XVII and Holographic Materials IX, (4 June 2003); doi: 10.1117/12.473953
Show Author Affiliations
Istvan Banyasz, Research Institute of Solid State Physics and Optics (Hungary)


Published in SPIE Proceedings Vol. 5005:
Practical Holography XVII and Holographic Materials IX
Tung H. Jeong; Sylvia H. Stevenson, Editor(s)

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