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Proceedings Paper

High-resolution index of refraction profiling of optical waveguides
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Paper Abstract

A comparison is made between three high spatial resolution index of refraction profiling techniques:reflection-NSOM, microreflection and AFM plus selective chemical etching using the very small elliptical core of a polarization maintaining E-fiber from Andrew Corporation as a test waveguide.

Paper Details

Date Published: 17 February 2003
PDF: 9 pages
Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); doi: 10.1117/12.473921
Show Author Affiliations
Roderick S. Taylor, National Research Council of Canada (Canada)
Cyril Hnatovsky, National Research Council of Canada (Canada)

Published in SPIE Proceedings Vol. 4833:
Applications of Photonic Technology 5

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