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On-line control of laser beam quality by means of diffractive optical components
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Paper Abstract

At LBOC6 meeting we presented an alternative approach for laser beam characterization, based on the decomposition of the electrical field distribution at certain cross section of the laser beam into a system of orthogonal functions. As such orthogonal function systems we selected "natural" laser eigenmodes of either GL or GH type. The looked for strength of the individual modal components then can be achieved by measuring the output signal of multi-channel correlation filters placed in a Fourier set-up, whereas the correlation filters themselves have been realized as DOEs by laser lithography. In between different systems of such GL and GH correlation filters have been designed, manufactured and experimentally tested with miscellaneous laser beams. Achieved results demonstrate a very good conformity between optical experiment and computer simulation. First attempts to compare results of our method with results of “standard” beam characterization methods (ISO11146) indicated principal conformity, but illustrated the continuing demand for a sophisticated adjustment procedure for the filter during application.

Paper Details

Date Published: 30 May 2003
PDF: 11 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.473581
Show Author Affiliations
Michael Rudolf Duparre, Friedrich-Schiller-Univ. Jena (Germany)
Carsten Rockstuhl, Univ. de Neuchatel (Switzerland)
Andreas Letsch, Institut fuer Strahlwerkzeuge-Univ. Stuttgart (Germany)
Siegmund Schroeter, Institut fuer Physikalische Hochtechnologie e.V. Jena (Germany)
Vladimir S. Pavelyev, Image Processing Systems Institute (Russia)

Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Adolf Giesen; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; Horst Weber; M. J. Soileau; Christopher J. Stolz, Editor(s)

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