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Proceedings Paper

Failure-mode analysis of high-power single-mode 980-nm pump laser diodes
Author(s): Aland K. Chin; Zhiping Wang; Kejian Luo; Alan Nelson; Zuntu Xu
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Paper Abstract

This study examines catastrophic optical damage in failed, single-mode, 980 nm, InGaAs/GaAlAs/GaAs, ridge wave-guide laser diodes. Analysis techniques were selected for their simplicity to provide quick evaluation of material and device quality. The analysis techniques are chemical etching, optical microscopy, infrared microscopy, and scanning electron microscopy.

Paper Details

Date Published: 19 June 2003
PDF: 7 pages
Proc. SPIE 4993, High-Power Fiber and Semiconductor Lasers, (19 June 2003); doi: 10.1117/12.473280
Show Author Affiliations
Aland K. Chin, Axcel Photonics, Inc. (United States)
Zhiping Wang, Axcel Photonics, Inc. (United States)
Kejian Luo, Axcel Photonics, Inc. (United States)
Alan Nelson, Axcel Photonics, Inc. (United States)
Zuntu Xu, Axcel Photonics, Inc. (United States)


Published in SPIE Proceedings Vol. 4993:
High-Power Fiber and Semiconductor Lasers
Mahmoud Fallahi; Jerome V. Moloney, Editor(s)

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