Share Email Print
cover

Proceedings Paper

Rigorous coupled-wave analysis for multilayered grating structures
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A numerically stable and systematic implementation of the rigorous coupled-wave analysis (RCWA) for the general multilayered grating structures is presented for both TE and TM modes. Numerical results of the approach are shown for the diffraction-based optical device as an example and are compared with the scalar diffraction method to illustrate the limited applicability of the scalar analysis.

Paper Details

Date Published: 19 June 2003
PDF: 10 pages
Proc. SPIE 4987, Integrated Optics: Devices, Materials, and Technologies VII, (19 June 2003); doi: 10.1117/12.473179
Show Author Affiliations
Wook Lee, Georgia Institute of Technology (United States)
Fahrettin Levent Degertekin, Georgia Institute of Technology (United States)


Published in SPIE Proceedings Vol. 4987:
Integrated Optics: Devices, Materials, and Technologies VII
Yakov S. Sidorin; Ari Tervonen, Editor(s)

© SPIE. Terms of Use
Back to Top