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Proceedings Paper

Superconductivity and structural changes of Ar ion-implanted YBa2Cu3O7-x thin films
Author(s): Yi Jie Li; Cong Xin Ren; Guo Liang Chen; Jian Min Chen; Shichang Zou
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Paper Abstract

The effects of Ar ion implantation on superconductivity and structural changes in epitaxial YBa2Cu3O7-x thin films have been studied using x-ray diffraction, scattering electron microscopy (SEM), and transmission electron microscopy (TEM). It was found that both the critical current density Jc and the superconducting transition temperature Tc significantly decreased with the fluence. The sample went through the metal to semiconductor to insulator transitions with the increase of fluence. The TEM images showed that the sample implanted with high fluence became amorphous.

Paper Details

Date Published: 1 November 1991
PDF: 5 pages
Proc. SPIE 1519, International Conference on Thin Film Physics and Applications, (1 November 1991); doi: 10.1117/12.47291
Show Author Affiliations
Yi Jie Li, Shanghai Institute of Metallurgy (China)
Cong Xin Ren, Shanghai Institute of Metallurgy (China)
Guo Liang Chen, Shanghai Institute of Metallurgy (China)
Jian Min Chen, Shanghai Institute of Metallurgy (China)
Shichang Zou, Shanghai Institute of Metallurgy (China)


Published in SPIE Proceedings Vol. 1519:
International Conference on Thin Film Physics and Applications

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