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Proceedings Paper

Automated laser trimming for ultralow error function GFF
Author(s): Pierre Bernard; Nathalie Gregoire; Ghislain Lafrance
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Paper Abstract

Gain flatness of optical amplifiers over the communication bandwidth is a key requirement of high performance optical wavelength division multiplexing (WDM) communication systems. Most often, a gain flattening filter (GFF) with a spectral response matching the inverse gain profile is incorporated within the amplifier. The chirped fiber Bragg grating (CFBG) is an attractive technology to produce GFFs, especially in cases where very low error functions are required. Error functions smaller than or equal to ±0.1 dB for the full operating temperature range are now possible. Moreover, the systematic errors from cascaded filters are much smaller than for thin-film GFF, a factor of importance in a long chain of amplifiers. To achieve this performance level, the high-frequency ripples normally associated with CFBG-GFF have been reduced by combining state-of-the-art holographic phase masks and advanced UV-writing techniques. Lastly, to eliminate the residual low-frequency ripples and localized errors, we developed a laser annealing-trimming station. This fully automated station combines both the aging process and final trimming of the GFF refractive index profile to exactly match the required transmission spectra. The use of self-adjusting algorithms assures quick convergence of the error function within a very tight error band. The capital expenditure necessary to implement this new tool is small in relation to the gain in precision, reliability and manufacturing cycle time.

Paper Details

Date Published: 15 April 2003
PDF: 10 pages
Proc. SPIE 4943, Fiber-based Component Fabrication, Testing, and Connectorization, (15 April 2003); doi: 10.1117/12.472703
Show Author Affiliations
Pierre Bernard, TeraXion Inc. (Canada)
Nathalie Gregoire, TeraXion Inc. (Canada)
Ghislain Lafrance, TeraXion Inc. (Canada)


Published in SPIE Proceedings Vol. 4943:
Fiber-based Component Fabrication, Testing, and Connectorization

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