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Proceedings Paper

Characterization of embedded fiber Bragg grating sensors written in high-birefringent optical fibers subjected to transverse loading
Author(s): Federico Bosia; Philippe Giaccari; Mauro Facchini; John Botsis; Hans G. Limberger; Rene-Paul Salathe
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Paper Abstract

Experimental, analytical and finite-element-simulation approaches are presented for the characterization of fibre Bragg grating sensors written in conventional monomode and polarization-maintaining fibers subjected to transverse loading. Firstly, a diametrical-load configuration is considered. Numerical simulations show the behavior to be nonlinear as a function of the applied load when an appropriate analytical model for the opto-mechanical response is employed. Secondly, experiments are carried out with the sensors embedded in epoxy specimens, when the latter are subjected to transversal biaxial loading. The response is monitored as a function of the vertical/horizontal load ratio. A finite-element model of the specimen with the embedded fibre and the previous analytical procedure are used to calculate the strain distributions in the fibre core resulting from loading, and predict the corresponding Bragg wavelength shifts. Experimental results are then compared to numerical predictions.

Paper Details

Date Published: 27 June 2002
PDF: 12 pages
Proc. SPIE 4694, Smart Structures and Materials 2002: Smart Sensor Technology and Measurement Systems, (27 June 2002); doi: 10.1117/12.472616
Show Author Affiliations
Federico Bosia, Swiss Federal Institute of Technology (Switzerland)
Philippe Giaccari, Swiss Federal Institute of Technology (Switzerland)
Mauro Facchini, Swiss Federal Institute of Technology (Switzerland)
John Botsis, Swiss Federal Institute of Technology (Switzerland)
Hans G. Limberger, Swiss Federal Institute of Technology (Switzerland)
Rene-Paul Salathe, Swiss Federal Institute of Technology (Switzerland)


Published in SPIE Proceedings Vol. 4694:
Smart Structures and Materials 2002: Smart Sensor Technology and Measurement Systems
Daniele Inaudi; Eric Udd, Editor(s)

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