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Proceedings Paper

Synchrotron-radiation-induced damages in optical materials
Author(s): Alexandre Gatto; Norbert Kaiser; Stefan Guenster; Detlev Ristau; Francesca Sarto; Mauro Trovo; M. B. Danailov
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Paper Abstract

Synchrotron radiation sources and free electron lasers (FEL) represent practical approaches to produce high photon flux down to the VUV wavelength region or the X-ray spectral range. But operating brilliant photon sources requires to overcome severe and crucial damage problems. Optical material are exposed to high power broad band radiation extending from far IR to gamma rays. Typically, materials suffer series of picoseconds pulses at MHz repetition rate with multi photon energy ranging from few eV to several keV. Damages observed on some oxide and fluoride materials irradiated with synchrotron radiation and UV free electron lasers are reviewed. Surface and bulk damages, increased roughness, modification of spectral properties and change of crystalline structures are observed and described. Contamination elements like carbon are detected as major aging factor.

Paper Details

Date Published: 30 May 2003
PDF: 8 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472487
Show Author Affiliations
Alexandre Gatto, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Norbert Kaiser, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Stefan Guenster, Laser Zentrum Hannover e.V. (Germany)
Detlev Ristau, Laser Zentrum Hannover e.V. (Germany)
Francesca Sarto, ENEA (Italy)
Mauro Trovo, Sincrotrone Trieste S.C.p.A. (Italy)
M. B. Danailov, Sincrotrone Trieste S.C.p.A. (Italy)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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