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Proceedings Paper

Advanced transient waveform digitizers
Author(s): Stuart Kleinfelder
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Paper Abstract

A series of multi-channel transient waveform digitization integrated circuits with up to 5 GHz sample rates and parallel 10-bit digitization has been designed, tested, and fabricated in large quantities. The current CMOS circuit uses four arrays of 128 fast switched capacitors per channel to record four parallel analog transient inputs. Triggering and clocking is provided by a current-mode adjustable asynchronous active delay line that uses look-ahead to generate 128 4-way interleaved clocks without the need for external high-speed clocking. After transient capture, each channel is fed into 128 parallel 10-bit analog to digital converters for fast, channel-parallel digitization, followed by digital readout. The fast triggering and waveform capture, channel-parallel digitization and convenient word-parallel digital readout results in a responsive and low dead-time system. Acquisition sample rates range from ~50 kHz to ~3 GHz. Analog input bandwidth is approximately 350 MHz. Fixed-pattern spatial noise, after on-chip digitization, is equivalent to ~5 mV RMS. Temporal noise is typically equivalent to ~1 mV RMS, for a signal to noise ratio of ~2,500:1, RMS. This integrated circuit, the "Analog Transient Waveform Digitizer," has been successfully used to instrument the AMANDA and KamLAND neutrino physics experiments, and has been selected for use in the IceCube neutrino observatory. Current efforts to improve this technology will yield larger array sizes, sample rates in excess of 10 GHz, analog bandwidth exceeding 1 GHz, higher conversion rates, lower dead-time, greater uniformity and enhanced flexibility and ease of use.

Paper Details

Date Published: 3 March 2003
PDF: 11 pages
Proc. SPIE 4858, Particle Astrophysics Instrumentation, (3 March 2003); doi: 10.1117/12.472486
Show Author Affiliations
Stuart Kleinfelder, Univ. of California/Irvine (United States)


Published in SPIE Proceedings Vol. 4858:
Particle Astrophysics Instrumentation
Peter W. Gorham, Editor(s)

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