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Proceedings Paper

Photothermal microscopy for in-situ study of laser damage induced by gold inclusions
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Paper Abstract

A photothermal microscope has been combined with an experimental set-up allowing damage threshold measurements at the same wavelength. The microscope is based on photothermal deflection of the transmitted probe beam: the CW pump beam (1.06 μm wavelength) and the probe beam are collinear and focused through the same objective. The diameter of the pump beam on the sample surface is 1 μm. Laser damage thresholds are measured thanks to a pulsed beam (1.06 μm wavelength and 6 nanosecond pulse) and the spatial position of the pulsed beam is controlled by a CCD camera. This experimental setup has been used to study the behavior of metallic inclusions in dielectric materials in laser damage processes. Results are presented with gold inclusions of about 600 nm in diameter in silica.

Paper Details

Date Published: 30 May 2003
PDF: 11 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472434
Show Author Affiliations
Annelise During, Institut Fresnel/ENSPM (France)
Mireille Commandre, Institut Fresnel/ENSPM (France)
Caroline Fossati, Institut Fresnel/ENSPM (France)
Jean-Yves Natoli, Institut Fresnel/ENSPM (France)
Jean-Luc Rullier, CEA-DAM Il de France (France)
Herve Bercegol, CEA-CESTA (France)
Philippe Bouchut, CEA-LETI (France)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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