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Proceedings Paper

Self-guiding, supercontinuum generation and damage in bulk materials induced by femtosecond pulses
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Paper Abstract

The dynamics of multiple pulse laser-induced damage in the form of cracking or nonlinear coloration in bulk materials (fused silica and borosilicate K8 glass) was studied under the irradiation by femtosecond pulses at 800 nm wavelength. A Ti:sapphire chirped pulse amplification system with ~130-fs pulse duration and ~1-mJ pulse energy at 1-kHz repetition rate was used in the experiment. Self-guided propagation of femtosecond pulses over greater than 1-cm lengths accompanied by intensive supercontinuum generation was observed and studied in an interaction geometry where the laser beam was focused in the middle of the thick (~4 cm) sample. The pulse energy value at which self-guided propagation and supercontinuum generation in fused silica was observed was ~60 times lower than the laser-induced damage threshold. The nonlinear coloration in K8 glass was present at pulse energy values which exceeded the threshold for self-guided propagation. Numerical simulations involving self-focusing, temporal dispersion and multiphoton absorption were found to be in good agreement with the experimental results.

Paper Details

Date Published: 30 May 2003
PDF: 12 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472427
Show Author Affiliations
Valdas Sirutkaitis, Vilnius Univ. (Lithuania)
Eugenijus Gaizauskas, Vilnius State Univ. (Lithuania)
Viacheslav Kudriashov, Vilnius Univ. (Lithuania)
Martynas Barkauskas, Vilnius Univ. (Lithuania)
Virgilijus Vaicaitis, Vilnius Univ. (Lithuania)
Rimantas Grigonis, Vilnius Univ. (Lithuania)
Algis S. Piskarskas, Vilnius Univ. (Lithuania)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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