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Proceedings Paper

Toward an absolute measurement of LIDT
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Paper Abstract

The improvement of LIDT value of optical components had lead to develop a lot of experimental setups and procedures of test around the world. In this context it is often very difficult to make accurate comparisons of laser damage threshold values between the different apparatus. The differences are due to the procedure of test, the spatial and temporal beam variations, the laser damage criterion and others. A specific laser damage testing apparatus, with an accurate damage initiation detection and allowing a real time acquisition of the different shot parameters, lead to exhibit the influence of each parameter on the damage process. Laser beam profiling is performed in real time and give access to the fluence for one pixel (0.2μm2), therefore an effective fluence or a pixel fluence can be calculated in order to reach an “absolute” threshold value. The metrology developed will be detailed and some results obtained on silica and BK7 at 1064nm and 355nm with different procedures of test will be presented and discussed to illustrate the aim of this study.

Paper Details

Date Published: 30 May 2003
PDF: 14 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472411
Show Author Affiliations
Jean-Yves Natoli, Institut Fresnel/ENSPM (France)
Laurent Gallais, Institut Fresnel/ENSPM (France)
Bertrand Bertussi, Institut Fresnel/ENSPM (France)
Mireille Commandre, Institut Fresnel/ENSPM (France)
Claude Amra, Institut Fresnel/ENSPM (France)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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