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Experimental results of laser interaction with included gold particles in silica at 1w and 3w (Abstract Only)
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Paper Abstract

In order to exhibit the role of laser damage precursor centers in silica, gold particles ranging from 0.2mm to 0.8mm have been included between two coatings of SiO2 deposited on silica substrates. UV and IR nano-second pulsed irradiations on samples with different SiO2 over-layer thicknesses (2, 5, 10 mm) has been performed. The damage morphologies observed with Nomarski and atomic force microscopes have shown to be dependent on fluence, wavelength and SiO2 over-layer thickness. In addition a localized irradiation study using 6mm spot size allows to aim accurately on an isolated particle. The measurement is compared to the experiments presented for a few hundred micrometers spot size. Indeed in this case we have to consider that several particles are simultaneously irradiated. A comparison between the respective morphologies could inform us on potential collective effects of the particles. The choice of experimental test conditions, and the whole associated results will be presented and discussed.

Paper Details

Date Published: 30 May 2003
PDF: 1 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472410
Show Author Affiliations
Jean-Yves Natoli, Institut Fresnel/ENSPM (France)
Laurent Gallais, Institut Fresnel/ENSPM (France)
Michela Perra, Institut Fresnel/ENSPM (France)
Florian Bonneau, CEA-DAM Il de France (France)
Patrick Combis, CEA-DAM Il de France (France)
Jean Luc Rullier, CEA-DAM Il de France (France)
Philippe Bouchut, CEA-LETI (France)
Laurent Lamaignere, CEA-CESTA (France)

Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Adolf Giesen; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; Horst Weber; M. J. Soileau; Christopher J. Stolz, Editor(s)

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