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Proceedings Paper

Numerical simulations of laser/defect-induced absorption in SiO2
Author(s): Florian Bonneau; Patrick Combis; A. Pujols; Jean-Luc Rullier; M. Seques; Jacques Vierne
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Paper Abstract

We have performed simulations of laser energy deposit in sub-micrometric spherical defects and the surrounding fused silica. We have studied crater generation produced by the absorber explosion with a 2D/3D Lagrange-Euler code taking into account crack formation and propagation in the brittle material. The comparison of the 2D simulations with experiment shows quite good agreement for shallow defects (depth < 2 μm). We have observed experimentally that the explosion of deeper absorbers results in a more complex crater morphology. Therefore we have begun performing 3D simulations in order to reproduce these features. Depending on the defect depth, the cracks may not reach the surface and a crater doesn't appear. Nevertheless, those cracks or pre-existing cracks can contribute to efficient electric field enhancement and breakdown on the surface. Different types of cracks (size, inclination, filled with a material or not) were investigated and the 2D or 3D electromagnetic field distributions were computed using a finite element code.

Paper Details

Date Published: 30 May 2003
PDF: 8 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472408
Show Author Affiliations
Florian Bonneau, CEA-DAM Ile de France (France)
Patrick Combis, CEA-DAM Ile de France (France)
A. Pujols, CEA-CESTA (France)
Jean-Luc Rullier, CEA-DAM Ile de France (France)
M. Seques, CEA-CESTA (France)
Jacques Vierne, CEA-DAM Ile de France (France)

Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Adolf Giesen; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; Horst Weber; M. J. Soileau; Christopher J. Stolz, Editor(s)

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