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Proceedings Paper

Using a TOF mass spectrometer for studies of laser interaction with 3-nm diameter gold nanoparticles embedded in silica
Author(s): Herve Bercegol; Florian Bonneau; Patrick Combis; Laurent Gallais; Laurent Lamaignere; Marc Loiseau; Jean-Yves Natoli; Michael J. Pellin; Michela Perra; Jean-Luc Rullier; M. Savina
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Paper Abstract

With the aim of observing and simulating laser initiated damage, ultra-pure silica "model" samples, seeded with gold nanoparticles (diameters 2 - 5 nm), were prepared and exposed to 3 ns laser pulses at wavelength 355 nm. These samples enable us to study the mechanism of damage initiation caused by inclusions of nanometric size, which is the typical size of defects occurring in optical quality glass. The samples were studied in a series of experiments using a time-of-flight mass spectrometer at Argonne National Laboratory. This installation is of great interest because it enables us to combine the laser irradiation of the sample with the chemical identification of material ejected from the exposed surface. An evaluation of the quantity of gold atoms emitted during irradiation can thus be obtained from the experimental results. These experimental data are completed with “Nomarski” and “atomic force” microscope observations, and then interpreted. In particular, a comparison is made to numerical simulations obtained with our DELPOR code. An encouraging result is the existence of a pre-damage phase at very low fluences that is not detectable by classical optical devices.

Paper Details

Date Published: 30 May 2003
PDF: 12 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472407
Show Author Affiliations
Herve Bercegol, CEA-CESTA (France)
Florian Bonneau, CEA-DAM Ile de France (France)
Patrick Combis, CEA-DAM Ile de France (France)
Laurent Gallais, Institut Fresnel/ENSPM (France)
Laurent Lamaignere, CEA-CESTA (France)
Marc Loiseau, CEA-CESTA (France)
Jean-Yves Natoli, Institut Fresnel/ENSPM (France)
Michael J. Pellin, Argonne National Lab. (United States)
Michela Perra, Institut Fresnel/ENSPM (France)
Jean-Luc Rullier, CEA-DAM Ile de France (France)
M. Savina, Argonne National Lab. (United States)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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