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Proceedings Paper

Practical absolute wavelength meter using iodine-stabilized diode laser
Author(s): Yoshiaki Akimoto; Lee Yong-Chol; Satoshi Hatano; Shoji Niki; Akiyoshi Irisawa
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Paper Abstract

A practical absolute wavelength meter was assembled separately a reference wavelength source and wavelength measurement system. The frequency (wavelength) stability was obtained to be 2×10-12 for a reference wavelength source. The other hand accuracy of wavelength measurement was estimated to be ** Michelson interferometer with vacuum chamber. The wavelength was estimated to be 1523.48813 nm for a 1523nm He-Ne laser as test laser. Moreover, the pressure dependence for wavelength was measured to be 0.0044 [pm/hPa]. Measurement reproducibility of the wavelength meter was guaranteed to be ±0.035pm.

Paper Details

Date Published: 30 May 2003
PDF: 9 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472399
Show Author Affiliations
Yoshiaki Akimoto, National Institute of Advanced Industrial Science and Technology (Japan)
Lee Yong-Chol, NEOARK Corp. (Japan)
Satoshi Hatano, NEOARK Corp. (Japan)
Shoji Niki, ADVANTEST Corp. (Japan)
Akiyoshi Irisawa, ADVANTEST Corp. (Japan)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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