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Proceedings Paper

Luminescence of UV thin films
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Paper Abstract

Luminescence measurements have been set up in order to study the interaction of UV-laser radiation with dielectric thin films. The pulsed laser excitation was carried out at 193-nm (6.4eV), the coating materials comprised wide-band-gap oxides and fluorides. Experiments show the significant optical response of single- and multilayer coatings on the low fluence excitation at sub-band-gap energy. Time- and spectrally-resolved measurements indicate characteristic emission bands of color centers in the deep-UV and vacuum-UV coating materials. An assignment of these optical transitions can be derived from the comparison with known bulk-material studies.

Paper Details

Date Published: 30 May 2003
PDF: 7 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472391
Show Author Affiliations
Joerg Heber, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Christian Muehlig, Institut fuer Physikalische Hochtechnologie e.V. Jena (Germany)
Wolfgang Triebel, Institut fuer Physikalische Hochtechnologie e.V. Jena (Germany)
Norbert Danz, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Roland Thielsch, Southwall Europe GmbH (Germany)
Norbert Kaiser, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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