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Proceedings Paper

Characterization device for diode-laser-stack beam propagation
Author(s): Markus Roehner; Holger Muentz; Olaf Schroeder; Konstantin Boucke; Reinhart Poprawe
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Paper Abstract

High beam quality can be achieved by accurate adjustment of the mechanical and micro-optical components in the manufacturing process of high power diode laser stacks. A charaterization device which can determine these parameters by automatically measuring the radiation properties of high-power diode-laser stacks has been developed. The result is a mechanically robust, easy to use characterization device of high reliability suited for applications in quality control and product optimization.

Paper Details

Date Published: 30 May 2003
PDF: 7 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472390
Show Author Affiliations
Markus Roehner, Fraunhofer-Institut fuer Lasertechnik (Germany)
Holger Muentz, Dilas Diodenlaser GmbH (Germany)
Olaf Schroeder, Modus High-Tech Electronics GmbH (Germany)
Konstantin Boucke, Fraunhofer-Institut fuer Lasertechnik (Germany)
Reinhart Poprawe, Fraunhofer-Institut fuer Lasertechnik (Germany)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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