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Proceedings Paper

Phase space analyzer with Gaussian slits
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Paper Abstract

The phase space analyzer is an optical device that uses slits, lenses and an irradiance-calibrated image detector in order to characterize optical beams. With such a device it is possible to obtain the beam power distribution along the two-dimensional phase space coordinates corresponding to a given transverse direction. The usual setup includes hard edge slits, and it has been considered in previous studies to measure stigmatic and simple astigmatic beams. We analyze a phase space analyzer with Gaussian slits to measure Gauss Schell-model beams. Special attention is given to general astigmatic beams (such as twisted irradiance and/or twisted phase beams), where a characterization along two orthogonal transverse axes is not enough.

Paper Details

Date Published: 30 May 2003
PDF: 8 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472381
Show Author Affiliations
Julio Serna, Univ. Complutense de Madrid (Spain)
George Nemes, Astigmat (United States)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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