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Proceedings Paper

Aspherical mirror measurement using a point diffraction interferometer
Author(s): Kazuya Ota; Takahiro Yamamoto; Yusuke Fukuda; Katsura Otaki; Iwao Nishiyama; Shinji Okazaki
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Paper Abstract

An point diffraction interferometry (PDI) system is used for measurement of EUV aspherical mirrors, because diffracted light by a small aperture has a nearly ideal spherical wavefront and EUV projection systems is designed with mild aspheres so that the mirrors can be tested at the center curvature without null optics. An advanced point diffraction interferometer has been developed and its precision and accuracy performance tested with a spherical mirror have been reported in last year1. After that, the diameter of the pinhole employed in the PDI system is switched from 1.0mm to 0.5mm in anticipation of measurement accuracy improvement. An aspherical mirror is measured, and the system error is estimated from the aspherical measurement data. In this system error estimation, an aspherical mirror designed for a four-mirrors EUV projection optics is used.

Paper Details

Date Published: 1 July 2002
PDF: 5 pages
Proc. SPIE 4688, Emerging Lithographic Technologies VI, (1 July 2002); doi: 10.1117/12.472343
Show Author Affiliations
Kazuya Ota, Association of Super-Advanced Electronics Technologies (Japan)
Takahiro Yamamoto, Association of Super-Advanced Electronics Technologies (Japan)
Yusuke Fukuda, Association of Super-Advanced Electronics Technologies (Japan)
Katsura Otaki, Association of Super-Advanced Electronics Technologies (Japan)
Iwao Nishiyama, Association of Super-Advanced Electronics Technologies (Japan)
Shinji Okazaki, Association of Super-Advanced Electronics Technologies (Japan)


Published in SPIE Proceedings Vol. 4688:
Emerging Lithographic Technologies VI
Roxann L. Engelstad, Editor(s)

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