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Proceedings Paper

Investigation of Ti-Al-Mo-V alloy nitride coatings by ARC technique
Author(s): Ren Wang; Guang Yao Yang; Bei Xin Wu; Bao Wei Fu; Yun Chang Zhan; Yun Han Zhang
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Paper Abstract

This paper introduces Ti-Al-Mo-V alloy nitride films grown on cemented carbide substrates using arc technique. Very hard, dense, and relatively smooth films, about 3 micrometers in thickness were obtained at aluminum content 20 - 30 at%. Such films exhibit high hardness value of over 4000 Hv 0.05 and better adhesion strength (critical load exceed 6 kgf) on cemented carbide substrates. The aluminum content in the films varies with the change of voltage of the substrates. All films were found, based upon x-ray diffraction, to be mainly (Ti, Al, Mo, V) N type compound nitride with (111) preferred orientation.

Paper Details

Date Published: 1 November 1991
PDF: 6 pages
Proc. SPIE 1519, International Conference on Thin Film Physics and Applications, (1 November 1991); doi: 10.1117/12.47232
Show Author Affiliations
Ren Wang, Beijing Univ. of Iron and Steel Technology (China)
Guang Yao Yang, Beijing Univ. of Iron and Steel Technology (China)
Bei Xin Wu, Beijing Univ. of Iron and Steel Technology (China)
Bao Wei Fu, Beijing Univ. of Iron and Steel Technology (China)
Yun Chang Zhan, Beijing Univ. of Iron and Steel Technology (China)
Yun Han Zhang, Beijing Union Univ. of Machinery Engineering (China)


Published in SPIE Proceedings Vol. 1519:
International Conference on Thin Film Physics and Applications

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