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Proceedings Paper

CAPELLA: a kHz and low-debris capillary discharge EUV source
Author(s): Eric Robert; Thierry Gonthiez; O. Sarroukh; A. L. Thomann; Raymond Viladrosa; Claude Fleurier; Jean-Michel Pouvesle; Christophe Cachoncinlle
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Paper Abstract

The development and operation of a multi watt, multi kHz and low debris EUV gas discharge source is reported. The Capillary EUV Lamp for Lithography Approach (CAPELLA) is designed and characterized for its application in the french EUV exposure tool named BEL. The burst operation at high repetition rate, up to 3 kHz, of the source during time period of a few seconds is described and shown to be relevant for the BEL application. The long time stability over hours is measured to be of 0.6 percent. Other technical BEL requirements such as energy flux, EUV output stability, spatial position stability, collection angle are briefly presented and their fulfilment is documented through the experimental data obtained on the CAPELLA prototype. An experimental characterization of debris nature and deposition rate on plasma facing silicon targets has been performed over millions of shots showing evidence of the crucial role of the discharge regime.

Paper Details

Date Published: 1 July 2002
PDF: 8 pages
Proc. SPIE 4688, Emerging Lithographic Technologies VI, (1 July 2002); doi: 10.1117/12.472276
Show Author Affiliations
Eric Robert, Univ. d'Orleans (France)
Thierry Gonthiez, Univ. d'Orleans (France)
O. Sarroukh, Univ. d'Orleans (France)
A. L. Thomann, Univ. d'Orleans (France)
Raymond Viladrosa, Univ. d'Orleans (France)
Claude Fleurier, Univ. d'Orleans (France)
Jean-Michel Pouvesle, Univ. d'Orleans (France)
Christophe Cachoncinlle, Univ. d'Orleans (France)


Published in SPIE Proceedings Vol. 4688:
Emerging Lithographic Technologies VI
Roxann L. Engelstad, Editor(s)

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