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Proceedings Paper

Interferometer for testing in vibration environments
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Paper Abstract

Temporal phase shifting interferometers require a stable environment during the data acquisition, so that well controlled phase steps can be introduced between successively acquired interferograms. In contrast, single-frame interferometers need to acquire only one interferogram to provide a phase map with very good precision at high spatial resolution. Thus these interferometers are well suited for the interferometric testing of large optics with long radius of curvature for which vibration isolation is difficult, e.g. testing astronomical telescope mirrors in a test tower, or testing space optics inside a cryogenic vacuum chamber. This paper describes the Instantaneous Phase Interferometer (IPI) by ADE Phase Shift, together with measurement results at NASA. The IPI consists of a polarization Twyman-Green interferometer operating at 632.8nm, with single-frame phase acquisition based on a spatial carrier technique. The spatial carrier fringes are generated by introducing large amount of tilt between the test beam and the reference beam. The phase information of the optical surface under test is encoded in the straightness of the interference fringes, which can be detected in a single frame with spatial sampling of 1000x1000 pixels. Measurements taken at the NASA Marshall Space Flight Center in support of the characterization of developmental optics for the Next Generation Space Telescope are presented. Such tests consist of a mirror placed inside a cryogenic vacuum chamber, with the IPI placed outside the test chamber without any additional vibration isolation.

Paper Details

Date Published: 20 June 2002
PDF: 12 pages
Proc. SPIE 4777, Interferometry XI: Techniques and Analysis, (20 June 2002); doi: 10.1117/12.472245
Show Author Affiliations
Klaus R. Freischlad, ADE Phase Shift (United States)
Ron Eng, NASA Marshall Space Flight Ctr. (United States)
James B. Hadaway, Univ. of Alabama in Huntsville (United States)

Published in SPIE Proceedings Vol. 4777:
Interferometry XI: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

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