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Proceedings Paper

Scaled multisensor inspection of extended surfaces for industrial quality control
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Paper Abstract

Reliable real-time surface inspection of extended surfaces with high resolution is needed in several industrial applications. With respect to an efficient application to extended technical components such as aircraft or automotive parts, the inspection system has to perform a robust measurement with a ratio of less then 10-6 between depth resolution and lateral extension. This ratio is at least one order beyond the solutions that are offered by existing technologies. The concept of scaled topometry consists of arranging different optical measurement techniques with overlapping ranges of resolution systematically in order to receive characteristic surface information with the required accuracy. In such a surface inspection system, an active algorithm combines measurements on several scales of resolution and distinguishes between local fault indicating structures with different extensions and global geometric properties. The first part of this active algorithm finds indications of critical surface areas in the data of every measurement and separates them into different categories. The second part analyses the detected structures in the data with respect to their resolution and decides whether a further local measurement with a higher resolution has to be performed. The third part positions the sensors and starts the refined measurements. The fourth part finally integrates the measured local data set into the overall data mesh. We have constructed a laboratory setup capable of measuring surfaces with extensions up to 1500mm x 1000mm x 500mm (in x-, y- and z-direction respectively). Using this measurement system we will be able to separate the fault indicating structures on the surface from the global shape and to classify the detected structures according to their extensions and characteristic shapes simultaneously. The level of fault detection probability will be applicable by input parameter control.

Paper Details

Date Published: 20 June 2002
PDF: 9 pages
Proc. SPIE 4777, Interferometry XI: Techniques and Analysis, (20 June 2002); doi: 10.1117/12.472225
Show Author Affiliations
Daniel Kayser, Bremen Institute of Applied Beam Technology (Germany)
Thorsten Bothe, Bremen Institute of Applied Beam Technology (Germany)
Wolfgang Osten, Bremen Institute of Applied Beam Technology (Germany)


Published in SPIE Proceedings Vol. 4777:
Interferometry XI: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

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