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Proceedings Paper

Some metrological issues in optical full-field techniques
Author(s): Yves Surrel
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Paper Abstract

In this paper, we recall some basic concepts and the vocabulary of metrology. We propose some terms which today are not present in the terminology recommended by ISO. We address also the data post-processing, in particular spatial smoothing that usually decreases a lot the spatial resolution. We recommend to separate in the analysis what we call the phase sensor and the phase-to-measurand mapping. In some cases, the larger part of the uncertainty comes from the parameters which are present in this mapping.

Paper Details

Date Published: 20 June 2002
PDF: 12 pages
Proc. SPIE 4777, Interferometry XI: Techniques and Analysis, (20 June 2002); doi: 10.1117/12.472222
Show Author Affiliations
Yves Surrel, Conservatoire National des Arts et Metiers (France)

Published in SPIE Proceedings Vol. 4777:
Interferometry XI: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

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