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Proceedings Paper

Microwave properties of YB2Cu3O7-x thin films characterized by an open resonator
Author(s): Shi Ping Zhou; Ke Qin Wu; A. Jabbar; Jia-Shan Bao; Weigen Luo; Aili Ding; Faji Wang
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Paper Abstract

We have performed millimeter-wave frequency (94 GHz) measurements on high quality YBa2Cu3O7-x superconducting films on yttrium stabilized (100) ZrO2, MgO substrates. The 0.2 micrometers thin films fabricated by the magnetron sputtering in- situ technique with the YBa2Cu3O7-x powders as the target exhibit superconducting transition temperature up to 88 K, critical current density of 6 * 105 A/cm2 77 K. X-ray diffraction spectrum, as well as scanning electron microscope photos, indicate these thin films are fully c-axis oriented, extremely high in density, and universally homogeneous. Millimeter-wave surface resistances have been measured on a hemisphere open resonator in the temperature range of 20 K to Tc and beyond. Surface resistance value at 94 GHz and 77 K for these films are found to be about 30 m(Omega) , nearly 1/4 as that for copper, and a two orders drop in the surface resistance within 4 K is observed. That indicates these films to be good materials for the application in millimeter- wave range, especially for fabricating microwave devices. We observed such low surface resistance in these thin films by virtue of the near absence of grain and phase boundaries in these films coupled with their high degree of crystalline orientation.

Paper Details

Date Published: 1 November 1991
PDF: 7 pages
Proc. SPIE 1519, International Conference on Thin Film Physics and Applications, (1 November 1991); doi: 10.1117/12.47206
Show Author Affiliations
Shi Ping Zhou, Shanghai Univ. of Science and Technology (China)
Ke Qin Wu, Shanghai Univ. of Science and Technology (China)
A. Jabbar, Shanghai Univ. of Science and Technology (China)
Jia-Shan Bao, Shanghai Univ. of Science and Technology (China)
Weigen Luo, Shanghai Ceramics Institute (China)
Aili Ding, Shanghai Ceramics Institute (China)
Faji Wang, Shanghai Ceramics Institute (China)


Published in SPIE Proceedings Vol. 1519:
International Conference on Thin Film Physics and Applications

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