Share Email Print
cover

Proceedings Paper

Measurement of the Wigner distribution of a helium neon laser with a spherical aberration and a tapered semiconductor laser using moving slit technology
Author(s): Bert J. Neubert; Wolf-Dieter Scharfe; Guenter Huber
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We determine the Wigner distribution of a laser experimentally from intensity profiles obtained by moving slit technology. In order to find out whether the phase calculated from a measured Wigner distribution can be trusted, we add a known spherical aberration to a Helium Noen laser by a plan-convex collimating lens orientated "the wrong way." The magnitude of the aberration can be influenced by the beam diameter at the lens. The M2-values calculated from the Wigner distribution of the aberrated beam at different levels of aberration is in agreement with theory. The coefficient of spherical aberration obtained from the measurement agrees with the one predicted by aberration theory if the impact of the aberration on the beam profiles is large enough (M2 > 1.2). The Wigner distribution of a tapered semiconductor laser is also examined. The measured phase at the semiconductor facet is aberrated. The aberration however can not be identified to origin from exit of the beam from high index semiconductor to air through a planar interface.

Paper Details

Date Published: 30 May 2003
PDF: 9 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472046
Show Author Affiliations
Bert J. Neubert, Rofin-Sinar Laser GmbH (Germany)
Institut fuer Laser-Physik-Univ. Hamburg (Germany)
Wolf-Dieter Scharfe, Rofin-Sinar Laser GmbH (Germany)
Guenter Huber, Institut fuer Laser-Physik-Univ. Hamburg (Germany)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

© SPIE. Terms of Use
Back to Top