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Proceedings Paper

Trapping of electrical charges and laser damage
Author(s): Janick Bigarre; Patrick Hourquebie; Ludovic Doucet
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Paper Abstract

The polishing of optical components introduces defects in subsurface that can contribute to the damage initiation and the decrease of optical performance. These defects can trap electric charges or could be precursors to color center. We have proposed to study subsurface defects generated by the surface finishing by using trapping of charges and cathodoluminescence measurements. These two techniques are complementary: the cathodoluminescence gives information on defects having radiative decay and the grounded current can also be sensitive to other defects having non-radiative decay. It is shown that they are able to distinguish the surface finishing of natural silica. The defects are mainly concentrated in the first micron layer. We have also found that the repartition of defects on the surface in not homogeneous.

Paper Details

Date Published: 30 May 2003
PDF: 10 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472037
Show Author Affiliations
Janick Bigarre, CEA-Le Ripault (France)
Patrick Hourquebie, CEA-Le Ripault (France)
Ludovic Doucet, CEA-Le Ripault (France)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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