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Proceedings Paper

Calculation of electric field intensity at dielectric interfaces
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Paper Abstract

This paper will develop the expression for the electric field in the vicinity of a dielectric interface. This work is an extension of previous calculations that specifically applied to total internal reflection (TIR) interfaces. This paper will show that some differences should be expected in damage thresholds for s and p polarization. Explicit derivation for a generalized interface will be given and previous work generalized to include sub and super critical angle reflection and reflection from non TIR components.

Paper Details

Date Published: 30 May 2003
PDF: 2 pages
Proc. SPIE 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, (30 May 2003); doi: 10.1117/12.472032
Show Author Affiliations
Jonathan W. Arenberg, TRW, Inc. (United States)


Published in SPIE Proceedings Vol. 4932:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz; Adolf Giesen; Horst Weber, Editor(s)

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