Share Email Print

Proceedings Paper

Double-diameter laser-scanned measuring system
Author(s): Guoyu Zhang; Xiping Xu; Xiuhua Fu; Chengzhi Li; Hongguang Sun
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Based on signal direction laser-scanned measuring technology, a double diameters laser-scanned measuring system is presented. The system adopts laser-scanned measuring technology combining with the special spectroscopic optical systems to form double directions laser-scanning beams, and to simultaneously realize high speed and accuracy non-contact automatic measurement of the diameters of two perpendicular directions at one section of measured workpiece. In this paper, the mathematical model of the measuring system is established. The working principle and overall structure of the system are introduced. The semiconductor laser beam transferred optical system, the scanning emitting and receiving optical systems; the optoelectronic transformation electronic system and microcomputer real-time control and data processing system are discussed in detail. The possibility of the system has been verified by experiments and errors analysis.

Paper Details

Date Published: 20 September 2002
PDF: 5 pages
Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); doi: 10.1117/12.471703
Show Author Affiliations
Guoyu Zhang, Changchun Univ. of Science and Technology (China)
Xiping Xu, Changchun Univ. of Science and Technology (China)
Xiuhua Fu, Changchun Univ. of Science and Technology (China)
Chengzhi Li, Changchun Univ. of Science and Technology (China)
Hongguang Sun, Northeast Normal University (China)

Published in SPIE Proceedings Vol. 4927:
Optical Design and Testing
Zhicheng Weng; Jose M. Sasian; Yongtian Wang, Editor(s)

© SPIE. Terms of Use
Back to Top