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Proceedings Paper

Characterization of a high-critical-temperature superconducting thin film by the ring resonator method
Author(s): Maurice Pyee; Pascal Meisse; Henry Baudrand; Michel Chaubet
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Paper Abstract

The realization of an experimental setup for the characterization of a high critical temperature superconductor (HTCS) thin film by a microwave measurement is described. This approach allows HTCS parameters, like surface resistance in microwaves, to be determined from experimental measurements.

Paper Details

Date Published: 1 September 1991
PDF: 9 pages
Proc. SPIE 1512, Infrared and Optoelectronic Materials and Devices, (1 September 1991); doi: 10.1117/12.47169
Show Author Affiliations
Maurice Pyee, Univ. de Paris VI (France)
Pascal Meisse, ENSAE (France)
Henry Baudrand, ENSEEIHT (France)
Michel Chaubet, CNES (France)


Published in SPIE Proceedings Vol. 1512:
Infrared and Optoelectronic Materials and Devices
Ahmed Naumaan; Carlo Corsi; Joseph M. Baixeras; Alain J. Kreisler, Editor(s)

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