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Proceedings Paper

Ellipsometric studies of the optical anisotropy of GdBa2Cu3O7-x epitaxial films
Author(s): Ansheng Liu; Ole Keller
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Paper Abstract

The optical anisotropy of GdBa2Cu3O7-x epitaxial films has been experimentally investigated by use of ellipsometry and polarized reflectance measurements. The individual principal components of the dielectric tensor of this new high-Tc compound are derived from ellipsometric measurements performed in the visible and infrared frequency regions. Our results show that this compound is highly anisotropic in the near infrared region, and that it exhibits strongly free-electron-like behavior in the c-axis direction at optical frequencies.

Paper Details

Date Published: 1 September 1991
PDF: 6 pages
Proc. SPIE 1512, Infrared and Optoelectronic Materials and Devices, (1 September 1991); doi: 10.1117/12.47167
Show Author Affiliations
Ansheng Liu, Univ. of Aalborg (Denmark)
Ole Keller, Univ. of Aalborg (Denmark)


Published in SPIE Proceedings Vol. 1512:
Infrared and Optoelectronic Materials and Devices
Ahmed Naumaan; Carlo Corsi; Joseph M. Baixeras; Alain J. Kreisler, Editor(s)

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