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Proceedings Paper

Bidirectional transmittance distribution function measurements on ZnSe and on ZnS Cleartran
Author(s): Mauro Melozzi; Alessandro Mazzoni; Gianfranco Curti
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Paper Abstract

In the present paper the optical transmittive properties of different thickness CVD ZnSe and CVD ZnS Cleartran samples are analyzed using BTDF at the He-Ne laser wavelength. The measurements obtained determine the combined surface and bulk scattering. Surface scatter dominates over bulk scattering for ZnSe, while for ZnS Cleartran the main contribution to the scattered field is given by the bulk. A criteria to assess the material thickness as a function of its scattering characteristics when it is used to realize multispectral imaging system windows is discussed. The results suggest that the thickness of ZnS Cleartran windows in a multispectral imaging system must not exceed few millimeters.

Paper Details

Date Published: 1 September 1991
PDF: 11 pages
Proc. SPIE 1512, Infrared and Optoelectronic Materials and Devices, (1 September 1991); doi: 10.1117/12.47160
Show Author Affiliations
Mauro Melozzi, Officine Galileo (Italy)
Alessandro Mazzoni, Officine Galileo (Italy)
Gianfranco Curti, Officine Galileo (Italy)


Published in SPIE Proceedings Vol. 1512:
Infrared and Optoelectronic Materials and Devices
Ahmed Naumaan; Carlo Corsi; Joseph M. Baixeras; Alain J. Kreisler, Editor(s)

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