Share Email Print
cover

Proceedings Paper

Hot carrier silicon phototransistor
Author(s): Steponas P. Asmontas; Jonas Gradauskas; Edmundas Sirmulis
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The photoelectric characteristics of silicon phototransistors are investigated. The device consists of three regions with different types of conductivity. The operation of the phototransistor is based on the hot carrier emission from the emitter into the base under IR laser irradiation. The current-voltage measurements on the emitter-base junction show that photo-induced current increases with the increase of forward bias voltage and decreases when reverse bias is applied. The characteristics of the collector photocurrent versus the collector- base voltage in the common-base configuration are very similar to static collector current vs the collector voltage characteristics of an ordinary bipolar transistor. Furthermore, the collector photocurrent increases with an exponential law when the emitter-base junction is forward biased.

Paper Details

Date Published: 1 September 1991
PDF: 4 pages
Proc. SPIE 1512, Infrared and Optoelectronic Materials and Devices, (1 September 1991); doi: 10.1117/12.47155
Show Author Affiliations
Steponas P. Asmontas, Semiconductor Physics Institute/Lithuanian Academy of Scienc (Lithuania)
Jonas Gradauskas, Semiconductor Physics Institute/Lithuanian Academy of Scienc (Lithuania)
Edmundas Sirmulis, Semiconductor Physics Institute/Lithuanian Academy of Scienc (Lithuania)


Published in SPIE Proceedings Vol. 1512:
Infrared and Optoelectronic Materials and Devices
Ahmed Naumaan; Carlo Corsi; Joseph M. Baixeras; Alain J. Kreisler, Editor(s)

© SPIE. Terms of Use
Back to Top