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Proceedings Paper

Semiconductor laser scanning optomechanical system in an integrated machine vision sensor
Author(s): Dawei Tu; Caixing Lin; Sheng Cheng; Juan Yang; Hairong Yin
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Paper Abstract

The design of a two-dimensional x-y scanner for an integrated machine vision sensor, which innovates a synchronized spot scanning triangulation imaging system for precision data within the near range and a laser radar (lidar) to get the coarse image at the far field, is discussed in this paper. To support the new idea of layer and modular structure of machine vision structure, the two set of imaging systems have in common with the same scanner for emitting and returning optics with one laser source, to ensure that the data from two imaging systems respectively are coordinated in time and space. After expounding the basic principle of laser triangulation range imaging system based on synchronized scanner, system parameters involving the optics, the electronics are determined according to the active range, image resolution, frame frequency, and the range accuracy.

Paper Details

Date Published: 20 September 2002
PDF: 7 pages
Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); doi: 10.1117/12.471213
Show Author Affiliations
Dawei Tu, Shanghai Univ. (China)
Caixing Lin, Shanghai Univ. (China)
Sheng Cheng, Shanghai Univ. (China)
Juan Yang, Shanghai Univ. (China)
Hairong Yin, Shanghai Univ. (China)


Published in SPIE Proceedings Vol. 4927:
Optical Design and Testing
Zhicheng Weng; Jose M. Sasian; Yongtian Wang, Editor(s)

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