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Proceedings Paper

Multiwavelength high-thermometry using spectrum analysis
Author(s): Xinmin Qi; Yiqing Gao; Huanming Chen; Lihua Yuan; Xiaojin Zhu; Jian Xing
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Paper Abstract

The formula of bi-wavelength-thermometry is given, which is used for characteristic signal process of arc plasma thermometry and its distribution. The principle of spectrometer is introduced simply. Through experiment research of the three kinds of current measuring ways, a method of spectrum measurement using multi-wavelength scan is presented, which is in favor of studying the spatial distribution of the thermal plasma field thoroughly.

Paper Details

Date Published: 20 September 2002
PDF: 4 pages
Proc. SPIE 4927, Optical Design and Testing, (20 September 2002); doi: 10.1117/12.471212
Show Author Affiliations
Xinmin Qi, Nanchang Institute of Aeronautical Technology (China)
Yiqing Gao, Nanchang Institute of Aeronautical Technology (China)
Huanming Chen, Nanchang Institute of Aeronautical Technology (China)
Lihua Yuan, Nanchang Institute of Aeronautical Technology (China)
Xiaojin Zhu, Nanchang Institute of Aeronautical Technology (China)
Jian Xing, Nanchang Institute of Aeronautical Technology (China)


Published in SPIE Proceedings Vol. 4927:
Optical Design and Testing
Zhicheng Weng; Jose M. Sasian; Yongtian Wang, Editor(s)

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