Share Email Print

Proceedings Paper

Mathematical modeling and standardization in holography
Author(s): Simon J. S. Brown
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

As the range of materials and applications for holographic and diffractive features grows, so manufacturers can provide customers with a host of options and formats. Increasingly customers are specifying what they require in more detail. This includes material specifications, residual chemical levels, release and adhesion properties, as well as the more obvious image details. To date one feature vital to any buyer that is poorly defined is the optical or diffractive properties of their hologram or diffractive element. The problem is confounded by those manufacturers that do measure or assess the diffractive properties of their products, as there is no agreement on what should be measured and how these measurements should be interpreted. This paper presents a technique that will form the basis of an assessment technique that will allow standardisation, should the industry decide it need it.

Paper Details

Date Published: 1 October 1991
PDF: 8 pages
Proc. SPIE 1509, Holographic Optical Security Systems, (1 October 1991); doi: 10.1117/12.47118
Show Author Affiliations
Simon J. S. Brown, Sheffield City Polytechnic (United Kingdom)

Published in SPIE Proceedings Vol. 1509:
Holographic Optical Security Systems
William F. Fagan, Editor(s)

© SPIE. Terms of Use
Back to Top