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Proceedings Paper

Nonlinear dynamics of current-modulated multitransverse-mode vertical-cavity surface-emitting lasers
Author(s): Angel Valle; Juan Manuel Lopez; Luis Pesquera; Sergei I. Turovets
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Paper Abstract

An analysis of the nonlinear dynamics of current modulated weakly index-guided VCSELs in a multi--transverse mode regime is performed by using a model that takes into account all the transverse modes supported by the waveguide. Nonlinear dynamical behavior is studied when applying current modulation of high frequency and large modulation depth. Chaotic behavior is obtained in the multitransverse mode regime due to transverse mode competition. Chaotic operation is such that multistability of the chaos-chaos type is observed. Injection of appropriate optical pulses can switch between different stable chaotic solutions. The case of a VCSEL in which the fundamental mode is selected is also analyzed. Nonlinear dynamics of the single mode VCSEL is such that the chaotic behavior is not present for the considered range of current modulation amplitudes and frequencies. Only periodic behaviors are observed, in such a way that multistability of different periodic solutions also appears. Switching between different stable periodic solutions also appears when appropriate external optical pulses are injected. Finally, we show that spontaneous emission noise increases the number of available channels in chaotic optical communication systems in which frequency division multiplexing with multi-transverse mode VCSELs is used.

Paper Details

Date Published: 12 June 2002
PDF: 12 pages
Proc. SPIE 4646, Physics and Simulation of Optoelectronic Devices X, (12 June 2002); doi: 10.1117/12.470518
Show Author Affiliations
Angel Valle, Univ. de Cantabria-CSIC (Spain)
Juan Manuel Lopez, Univ. de Cantabria-CSIC (Spain)
Luis Pesquera, Univ. de Cantabria-CSIC (Spain)
Sergei I. Turovets, Siros Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 4646:
Physics and Simulation of Optoelectronic Devices X
Peter Blood; Marek Osinski; Yasuhiko Arakawa, Editor(s)

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