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Proceedings Paper

Simple and effective technique for the evaluation of optical field emitted from a SNOM probe tip
Author(s): Takashi Fukuda; Kimio Sumaru; Yoshihito Narita; Tsutomu Inoue; Fuminori Sato; Hiro Matsuda
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Paper Abstract

Regarding the characterization of the spatial distribution and the polarization condition of optical field emitted from a probe tip of scanning near-field optical microscope (SNOM), simple and effective evaluation technique is developed. It is realized in connection with the detailed knowledge of photo-induced surface relief formation phenomenon that occurs on the azobenzene functionalized polymer film. Since there was no easy method of evaluating a SNOM probe so far, this could be one of the promising techniques much more convenient than conventional methods. In this report, first the PSR phenomenon is explained and then several examples for the probe evaluation are demonstrated in far- and near-field condition. Furthermore, a trial for nano-patterning and ultra-high density rewritable data storage is performed via scanning near-field optical lithography.

Paper Details

Date Published: 13 June 2002
PDF: 10 pages
Proc. SPIE 4642, Organic Photonic Materials and Devices IV, (13 June 2002); doi: 10.1117/12.470450
Show Author Affiliations
Takashi Fukuda, National Institute of Advanced Industrial Science and Technology (Japan)
Kimio Sumaru, National Institute of Advanced Industrial Science and Technology (Japan)
Yoshihito Narita, JASCO Corp. (Japan)
Tsutomu Inoue, JASCO Corp. (Japan)
Fuminori Sato, JASCO Corp. (Japan)
Hiro Matsuda, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 4642:
Organic Photonic Materials and Devices IV
Bernard Kippelen; Donal D. C. Bradley, Editor(s)

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