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Proceedings Paper

Leakage of a guided mode caused by static and light-induced inhomogeneities in channel HTPE-LiNbO3 waveguides
Author(s): Sergey M. Kostritskii; Yuri N. Korkishko; Vyacheslav A. Fedorov; Alexander N. Alkaev; Vladmir S. Kritzak; Paul Moretti; Sorin Tascu; Bernard Jacquier
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Paper Abstract

In this paper, we report characterization of insertion losses, mode profiles and intensity distributions in channel LiNbO3 optical waveguide fabricated by High-Temperature Proton Exchange (HTPE). Optimal fabrication parameters were chosen in accordance with results obtained for test samples of a planar waveguide. A target wavelength of our optimization procedure was 810 - 840 nm, as fabrication of phase modulator used in sensor is developed. The guided mode intensity has been mapped by scanning near-field optical microscopy with a sub-wavelength resolution (<100 nm), simultaneously with observation of the topography of the scanned area (100 μm x 100 μm). These measurements offer important information about loss mechanisms in our waveguides.

Paper Details

Date Published: 3 April 2003
PDF: 7 pages
Proc. SPIE 4944, Integrated Optical Devices: Fabrication and Testing, (3 April 2003); doi: 10.1117/12.470323
Show Author Affiliations
Sergey M. Kostritskii, Moscow Institute of Electronic Technology (Russia)
Optolink, Ltd. (Russia)
Yuri N. Korkishko, Moscow Institute of Electronic Technology (Russia)
Optolink, Ltd. (Russia)
Vyacheslav A. Fedorov, Moscow Institute of Electronic Technology (Russia)
Optolink, Ltd. (Russia)
Alexander N. Alkaev, Moscow Institute of Electronic Technology (Russia)
Optolink, Ltd. (Russia)
Vladmir S. Kritzak, Moscow Institute of Electronic Technology (Russia)
Optolink, Ltd. (Russia)
Paul Moretti, Univ. de Claude Bernard Lyon 1 (France)
Sorin Tascu, Univ. de Claude Bernard Lyon 1 (France)
Bernard Jacquier, Univ. de Claude Bernard Lyon 1 (France)


Published in SPIE Proceedings Vol. 4944:
Integrated Optical Devices: Fabrication and Testing

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