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Proceedings Paper

Detection of sample parameters in secondary electron microscope images: test results
Author(s): Sowmya Mahadevan; David P. Casasent
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Paper Abstract

Secondary electron microscope images (SEIs) are analyzed in an automatic system to provide material properties for fracture analyses etc. The image processing presently used is summarized and initial results presented. Our new grain boundary (GB) detection and line following algorithms are presented. Line following locates triple junctions (TJs) (points where 3 grains meet). Initial versions of advanced algorithms to calculate TJ angles, reduce false GBs and TJs and select a reduced number of good probe points are advanced using a new noise map. Registration and formation of mosaic images are also addressed. Results on about 2000 sector images in 5 slices are presented.

Paper Details

Date Published: 7 June 2002
PDF: 9 pages
Proc. SPIE 4735, Hybrid Image and Signal Processing VIII, (7 June 2002); doi: 10.1117/12.470107
Show Author Affiliations
Sowmya Mahadevan, Carnegie Mellon Univ. (United States)
David P. Casasent, Carnegie Mellon Univ. (United States)

Published in SPIE Proceedings Vol. 4735:
Hybrid Image and Signal Processing VIII
David P. Casasent; Andrew G. Tescher, Editor(s)

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