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Proceedings Paper

Nonlinear optical properties of different types of proton-exchanged LiNbO3 and LiTaO3 waveguides
Author(s): Yuri N. Korkishko; Vyacheslav A. Fedorov; Sergey M. Kostritskii; Alexander N. Alkaev; Evgeny I. Maslennikov; Fredrik Laurell
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Paper Abstract

Reflection second-harmonic generation (SHG) from the polished waveguide end face is used to investigate the second-order nonlinear optical properties of different types of PE LiNbO3 and LiTaO3 waveguides in different HxLi1-xNbO3 and HxLi1-xTaO3 phases: as-exchanged and annealed proton-exchanged (APE) waveguides, high-temperature proton-exchanged (HTPE) waveguides, as well as reverse proton exchanged (RPE) waveguides. A detailed correlation is done between the nonlinear properties, the processing conditions, crystal structure parameters, the refractive index changes and the optical losses of the waveguides. The intensity of reflected SH signal, strongly reduced after the initial proton exchange in both LiNbO3 and LiTaO3, is found to be restored and even increased after annealing. However, this apparent increase of the nonlinearity is accompanied by high scattering and a strong degradation of the quality of the SHG reflected beam in the region of initial step-like PE waveguides. The recently proposed HTPE technique has been shown to produce high-quality alpha-phase PE LiNbO3 or PE LiTaO3 waveguides with essentially undegraded nonlinear optical properties. It has been also shown that the nonlinear properties of annealed proton exchanged LiNbO3 and LiTaO3 waveguides can be effectively recovered by the reverse proton exchange technique.

Paper Details

Date Published: 3 April 2003
PDF: 12 pages
Proc. SPIE 4944, Integrated Optical Devices: Fabrication and Testing, (3 April 2003); doi: 10.1117/12.469665
Show Author Affiliations
Yuri N. Korkishko, Moscow Institute of Electronic Technology (Russia)
Vyacheslav A. Fedorov, Moscow Institute of Electronic Technology (Russia)
Sergey M. Kostritskii, Moscow Institute of Electronic Technology (Russia)
Alexander N. Alkaev, Moscow Institute of Electronic Technology (Russia)
Evgeny I. Maslennikov, Moscow Institute of Electronic Technology (Russia)
Fredrik Laurell, Royal Institute of Technology (Sweden)


Published in SPIE Proceedings Vol. 4944:
Integrated Optical Devices: Fabrication and Testing

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