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Proceedings Paper

Atomic force acoustic microscopy at ultrasonic frequencies
Author(s): Walter Arnold; S. Hirsekorn; Malgorzata Kopycinska-Mueller; Ute Rabe; Michael Reinstaedtler; V. Scherer
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Paper Abstract

Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surface or tip is scanned, belong to the standard features of most commercial instruments. With these techniques images can be obtained the contrast of which depend on the elasticity of the sample surface. Quantitative determination of Young's modulus of a sample surface with AFM is a challenge, especially when stiff materials such as hard metals or ceramics are encountered. The evaluation of the cantilever vibration spectra at ultrasonic frequencies provides a way to discern local elastic data quantitatively using the flexural vibration modes. Nanocrystalline magnetic materials, multi- domain piezoelectric materials, polymeric materials, diamond-like carbon layers, silicon, and soft clay have been examined. Images obtained at the contact resonance frequencies are presented whose contrast is based on the elastic differences of the surface structure of the various materials examined. The spatial resolution is approximately 10 nm. Applying an electrical ac-field between the tip and the surface of a piezoelectric sample, images can be generated whose contrast is additionally influenced by the piezoelectric and dielectric properties of the sample. Furthermore, we present a new approach for studying friction and the stick-slip phenomenon using the torsional resonances of AFM cantilevers.

Paper Details

Date Published: 7 June 2002
PDF: 12 pages
Proc. SPIE 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems, (7 June 2002); doi: 10.1117/12.469631
Show Author Affiliations
Walter Arnold, Fraunhofer Institute for Nondestructive Testing (Germany)
S. Hirsekorn, Fraunhofer Institute for Nondestructive Testing (Germany)
Malgorzata Kopycinska-Mueller, Fraunhofer Institute for Nondestructive Testing (Poland)
Ute Rabe, Fraunhofer Institute for Nondestructive Testing (Germany)
Michael Reinstaedtler, Fraunhofer Institute for Nondestructive Testing (Germany)
V. Scherer, Fraunhofer Institute for Nondestructive Testing (Germany)


Published in SPIE Proceedings Vol. 4703:
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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